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Jessica Lynn Caldwell

Post Doc
Smart Materials
Jessica Lynn Caldwell
Research center
Education

Title: PhD in Materials Science
Institute: Adolphe Merkle Institute, University of Fribourg
Location: Fribourg
Country: Switzerland
From: 2020 To: 2023

Title: Masters in the Chemistry and Physics of Soft Materials
Institute: Adolphe Merkle Institute, University of Fribourg
Location: Fribourg
Country: Switzerland
From: 2017 To: 2019

Title: Bachelors in Biology
Institute: Indiana University Purdue University Columbus
Location: Columbus, Indiana
Country: USA
From: 2014 To: 2017

All Publications
2025
Caldwell J., Ferrari G., Isa V., Seveso D., Athanassiou A., Fragouli D.
Diversifying Available Micro- and Nanoplastic Reference Particles for (Eco)Toxicological Assays—A Model Study with Polylactic Acid
FORUM NAZIONALE DELLA BIODIVERSITÀ
Poster Conference
2025
Caldwell J., Porro M., Athanassiou A., Fragouli D.
Diversifying Available Micro- and Nanoplastic Reference Particles: Model Studies with Polylactic Acid
MICROplastics in Organic-rich Matrices
Poster Conference
2024
Glaubitz C., Bazzoni A., Neururer C., Locher R., Dorbic K., Caldwell J., Spuch-Calvar M., Lorenzo L.R., Balog S., Serneels V., Rothen-Rutishauser B., Fink A.P.
Correct labelling? A full analytical pathway for silica and titania particles in food products
Current Research in Food Science, vol. 9
Article Journal
2024
Caldwell J., Rodriguez-Lorenzo L., Espina B., Beck A., Stock F., Voges K., Pabortsava K., Feltham C., Horton A., Lampitt R., Rothen-Rutishauser B., Taladriz-Blanco P., Petri-Fink A.
Detection of submicron- and nanoplastics spiked in environmental fresh- and saltwater with Raman spectroscopy
Marine Pollution Bulletin, vol. 203
Article Journal
2023
Caldwell J., Loussert-Fonta C., Toullec G., Heidelberg Lyndby N., Haenni B., Taladriz-Blanco P., Espina B., Rothen-Rutishauser B., Petri-Fink A.
Correlative Light, Electron Microscopy and Raman Spectroscopy Workflow To Detect and Observe Microplastic Interactions with Whole Jellyfish
Environmental Science and Technology, vol. 57, (no. 16), pp. 6664-6672